X-ray microprobe of orbital alignment in strong-field ionized atoms.
نویسندگان
چکیده
We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (10(14) - 10(15) W/cm2). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-field ionization of krypton atoms via resonant, polarized x-ray absorption. We found strong alignment to persist for a period long compared to the spin-orbit coupling time scale (6.2 fs). The observed degree of alignment can be explained by models that incorporate spin-orbit coupling. The methodology is applicable to a wide range of problems.
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عنوان ژورنال:
- Physical review letters
دوره 97 8 شماره
صفحات -
تاریخ انتشار 2006